Strain isolation structures for stretchable electronics

ABSTRACT

Buffer structures are provided that can be used to reduce a strain in a conformable electronic system that includes compliant components in electrical communication with more rigid device components. The buffer structures are disposed on, or at least partially embedded in, the conformable electronic system such that the buffer structures overlap with at least a portion of a junction region between a compliant component and a more rigid device component. The buffer structure can have a higher value of Young&#39;s modulus than an encapsulant of the conformable electronic system.

CROSS-REFERENCE TO RELATED APPLICATIONS

This application claims priority to and benefit of U.S. ProvisionalApplication No. 61/768,939, filed on Feb. 25, 2013, entitled“MULTI-LAYER THIN FILM STRETCHABLE INTERCONNECTS,” which provisionalapplication is incorporated herein by reference in its entirety,including drawings.

BACKGROUND

High quality medical sensing and imaging data has become increasinglybeneficial in the diagnoses and treatment of a variety of medicalconditions. The conditions can be associated with the digestive system,the cardio-circulatory system, and can include injuries to the nervoussystem, cancer, and the like. To date, most electronic systems thatcould be used to gather such sensing or imaging data have been rigid andinflexible. These rigid electronics are not ideal for many applications,such as in biomedical devices. Most of biological tissue is soft andcurved. The skin and organs are delicate and far from two-dimensional.

Other potential applications of electronics systems, such as forgathering data in non-medical systems, also can be hampered by rigidelectronics.

SUMMARY

The Inventors have recognized that the inflexibility of electronicsystems in use are not ideal for many applications.

In view of the foregoing, various examples described herein are directedgenerally to systems, apparatus and methods for providing strainisolation in a conformable electronic system. The systems, methods andapparatus described herein provide effective, compact, and complexsystems that include stretchable and/or flexible interconnects inelectrical communication with more rigid device components.

In an example, buffer structures are described that effectivelyredistributes the strain that might normally act at or near an edge ofthe more rigid device component or on a junction region between thestretchable and/or flexible interconnects and the more rigid devicecomponents.

In an example, a system, apparatus and method is provided that is basedon thin device islands, including integrated circuitry (IC) chips and/orstretchable and/or flexible interconnects that are encapsulated in anencapsulant.

In an example, a system, apparatus and method is provided that includesa device component, at least one conductive stretchable and/or flexibleinterconnect in electrical communication with the device component, theat least one conductive stretchable and/or flexible interconnect formingthe electrical communication with the device component at a junctionregion, a buffer structure, and an encapsulant encapsulating at leastthe device component and the junction region. The buffer structureoverlaps with at least a portion of the junction region. The bufferstructure has a higher value of Young's modulus than the encapsulant.

In an example, a system, apparatus and method is provided that includesa device component, at least one conductive stretchable and/or flexibleinterconnect in electrical communication with the device component, theat least one conductive stretchable and/or flexible interconnect formingthe electrical communication with the device component at a junctionregion, a first buffer structure disposed over the device component, asecond buffer structure disposed below the device component, and anencapsulant encapsulating at least the device component and the junctionregion. The first buffer structure and the second buffer structureoverlap with at least a portion of the junction region. The first bufferstructure and the second buffer structure have a higher value of Young'smodulus than the encapsulant.

In an example, a system, apparatus and method is provided that includesa device component, a flexible base, the device component being disposedon, or at least partially embedded in, the flexible base, at least oneconductive stretchable and/or flexible interconnect in electricalcommunication with the device component, the at least one conductivestretchable and/or flexible interconnect forming the electricalcommunication with the device component at a junction region, a bufferstructure, and an encapsulant encapsulating at least the devicecomponent and the junction region. The buffer structure overlaps with atleast a portion of the flexible base. The flexible base has a highervalue of Young's modulus than the encapsulant. The buffer structure hasa higher value of Young's modulus than the encapsulant.

The following publications, patents, and patent applications are herebyincorporated herein by reference in their entirety:

-   Kim et al., “Stretchable and Foldable Silicon Integrated Circuits,”    Science Express, Mar. 27, 2008, 10.1126/science.1154367;-   Ko et al., “A Hemispherical Electronic Eye Camera Based on    Compressible Silicon Optoelectronics,” Nature, Aug. 7, 2008, vol.    454, pp. 748-753;-   Kim et al., “Complementary Metal Oxide Silicon Integrated Circuits    Incorporating Monolithically Integrated Stretchable Wavy    Interconnects,” Applied Physics Letters, Jul. 31, 2008, vol. 93,    044102;-   Kim et al., “Materials and Noncoplanar Mesh Designs for Integrated    Circuits with Linear Elastic Responses to Extreme Mechanical    Deformations,” PNAS, Dec. 2, 2008, vol. 105, no. 48, pp.    18675-18680;-   Meitl et al., “Transfer Printing by Kinetic Control of Adhesion to    an Elastomeric Stamp,” Nature Materials, January, 2006, vol. 5, pp.    33-38;-   U.S. Patent Application publication no. 2010 0002402-A1, published    Jan. 7, 2010, filed Mar. 5, 2009, and entitled “STRETCHABLE AND    FOLDABLE ELECTRONIC DEVICES;”-   U.S. Patent Application publication no. 2010 0087782-A1, published    Apr. 8, 2010, filed Oct. 7, 2009, and entitled “CATHETER BALLOON    HAVING STRETCHABLE INTEGRATED CIRCUITRY AND SENSOR ARRAY;”-   U.S. Patent Application publication no. 2010 0116526-A1, published    May 13, 2010, filed Nov. 12, 2009, and entitled “EXTREMELY    STRETCHABLE ELECTRONICS;”-   U.S. Patent Application publication no. 2010 0178722-A1, published    Jul. 15, 2010, filed Jan. 12, 2010, and entitled “METHODS AND    APPLICATIONS OF NON-PLANAR IMAGING ARRAYS;” and-   U.S. Patent Application publication no. 2010 027119-A1, published    Oct. 28, 2010, filed Nov. 24, 2009, and entitled “SYSTEMS, DEVICES,    AND METHODS UTILIZING STRETCHABLE ELECTRONICS TO MEASURE TIRE OR    ROAD SURFACE CONDITIONS.”-   Kim, D. H. et al. (2010). Dissolvable films of silk fibroin for    ultrathin conformal bio-integrated electronics. Nature Materials, 9,    511-517.-   Omenetto, F. G. and D. L. Kaplan. (2008). A new route for silk.    Nature Photonics, 2, 641-643.-   Omenetto, F. G., Kaplan, D. L. (2010). New opportunities for an    ancient material. Science, 329, 528-531.-   Halsed, W. S. (1913). Ligature and suture material. Journal of the    American Medical Association, 60, 1119-1126.-   Masuhiro, T., Yoko, G., Masaobu, N., et al. (1994). Structural    changes of silk fibroin membranes induced by immersion in methanol    aqueous solutions. Journal of Polymer Science, 5, 961-968.-   Lawrence, B. D., Cronin-Golomb, M., Georgakoudi, I., et al. (2008).    Bioactive silk protein biomaterial systems for optical devices.    Biomacromolecules, 9, 1214-1220.-   Demura, M., Asakura, T. (1989). Immobilization of glucose oxidase    with Bombyx mori silk fibroin by only stretching treatment and its    application to glucose sensor. Biotechnololgy and Bioengineering,    33, 598-603.-   Wang, X., Zhang, X., Castellot, J. et al. (2008). Controlled release    from multilayer silk biomaterial coatings to modulate vascular cell    responses. Biomaterials, 29, 894-903.-   U.S. patent application Ser. No. 12/723,475 entitled “SYSTEMS,    METHODS, AND DEVICES FOR SENSING AND TREATMENT HAVING STRETCHABLE    INTEGRATED CIRCUITRY,” filed Mar. 12, 2010.-   U.S. patent application Ser. No. 12/686,076 entitled “Methods and    Applications of Non-Planar Imaging Arrays,” filed Jan. 12, 2010.-   U.S. patent application Ser. No. 12/636,071 entitled “Systems,    Methods, and Devices Using Stretchable or Flexible Electronics for    Medical Applications,” filed Dec. 11, 2009.-   U.S. Patent Application publication no 2012-0065937-A1, published    Mar. 15, 2012, and entitled “METHODS AND APPARATUS FOR MEASURING    TECHNICAL PARAMETERS OF EQUIPMENT, TOOLS AND COMPONENTS VIA    CONFORMAL ELECTRONICS.”-   U.S. patent application Ser. No. 12/616,922 entitled “Extremely    Stretchable Electronics,” filed Nov. 12, 2009.-   U.S. patent application Ser. No. 12/575,008 entitled “Catheter    Balloon Having Stretchable Integrated Circuitry and Sensor Array,”    filed on Oct. 7, 2009.-   U.S. patent application Ser. No. 13/336,518 entitled “Systems,    Methods, and Devices Having Stretchable Integrated Circuitry for    Sensing and Delivering Therapy,” filed Dec. 23, 2011.

It should be appreciated that all combinations of the foregoing conceptsand additional concepts described in greater detail below (provided suchconcepts are not mutually inconsistent) are contemplated as being partof the inventive subject matter disclosed herein. It also should beappreciated that terminology explicitly employed herein that also mayappear in any disclosure incorporated by reference should be accorded ameaning most consistent with the particular concepts disclosed herein.

BRIEF DESCRIPTION OF THE DRAWINGS

The skilled artisan will understand that the figures, described herein,are for illustration purposes only, and that the drawings are notintended to limit the scope of the disclosed teachings in any way. Insome instances, various aspects or features may be shown exaggerated orenlarged to facilitate an understanding of the inventive conceptsdisclosed herein (the drawings are not necessarily to scale, emphasisinstead being placed upon illustrating the principles of the teachings).In the drawings, like reference characters generally refer to likefeatures, functionally similar and/or structurally similar elementsthroughout the various figures.

FIGS. 1A and 1B show top and cross-sectional side views of an exampleconformable electronic system, according to the principles describedherein.

FIGS. 2A and 2B show top and cross-sectional side views of an exampleconformable electronic system, according to the principles describedherein.

FIG. 3A shows an example apparatus that includes a strain isolationstructure, according to the principles described herein.

FIG. 3B shows example results of a finite element analysis of theexample apparatus of FIG. 3A, according to the principles describedherein.

FIG. 4 shows a plot of an example distribution of strain in an exampleapparatus, according to the principles described herein.

FIGS. 5A-5B show top and cross-sectional side views of an exampleapparatus, according to the principles described herein.

FIGS. 6A-6B show top and cross-sectional side views of another exampleapparatus, according to the principles described herein.

FIG. 7A-7B show cross-sectional side views of other example apparatus,according to the principles described herein.

FIG. 8A-8B show cross-sectional side views of other example apparatus,according to the principles described herein.

FIG. 9A show examples of buffer structures that have a substantiallypolygonal prism conformation, according to the principles describedherein

FIGS. 9B-9C show examples of buffer structure having an irregularstructure, according to the principles described herein.

FIG. 10 shows a top view of another example apparatus, according to theprinciples described herein.

FIG. 11A shows a cross-sectional side view of another example apparatus,according to the principles described herein.

FIG. 11B shows the finite element model approximation for the componentsin an example computation of an example apparatus, according to theprinciples described herein.

FIGS. 12A and 12B show example results of the finite elementcomputations of FIG. 11B, according to the principles described herein.

FIG. 13 shows a plot of the von Mises strain and first principal strainversus relative elongation for the example computation of FIGS. 12A and12B, according to the principles described herein.

DETAILED DESCRIPTION

Following below are more detailed descriptions of various conceptsrelated to, and embodiments of, an apparatus and systems for embeddingthinned chips in a flexible polymer. It should be appreciated thatvarious concepts introduced above and described in greater detail belowmay be implemented in any of numerous ways, as the disclosed conceptsare not limited to any particular manner of implementation. Examples ofspecific implementations and applications are provided primarily forillustrative purposes.

As used herein, the term “includes” means includes but is not limitedto, the term “including” means including but not limited to. The term“based on” means based at least in part on. As used herein, the term“disposed on” or “disposed above” is defined to encompass “at leastpartially embedded in.”

With respect to substrates or other surfaces described herein inconnection with various examples of the principles herein, anyreferences to “top” surface and “bottom” surface are used primarily toindicate relative position, alignment and/or orientation of variouselements/components with respect to the substrate and each other, andthese terms do not necessarily indicate any particular frame ofreference (e.g., a gravitational frame of reference). Thus, reference toa “bottom” of a substrate or a layer does not necessarily require thatthe indicated surface or layer be facing a ground surface. Similarly,terms such as “over,” “under,” “above,” “beneath” and the like do notnecessarily indicate any particular frame of reference, such as agravitational frame of reference, but rather are used primarily toindicate relative position, alignment and/or orientation of variouselements/components with respect to the substrate (or other surface) andeach other. The terms “disposed on” “disposed in” and “disposed over”encompass the meaning of “embedded in,” including “partially embeddedin.” In addition, reference to feature A being “disposed on,” “disposedbetween,” or “disposed over” feature B encompasses examples wherefeature A is in contact with feature B, as well as examples where otherlayers and/or other components are positioned between feature A andfeature B.

A system, apparatus and method described herein provides strainisolation in a conformable electronic system. In order to createeffective, compact, and durable systems, buffer structures are describedherein that can be used to reduce a strain that can be exerted near ajunction region between a stretchable and/or flexible interconnect orflexible interconnect and a device island when the conformableelectronic system is subjected to stretching or torsion. The bufferstructures according to the principles described herein are comprised ofa material having elastic properties that can effectively redistributethe strain acting on the junction region between stretchable and/orflexible interconnects and rigid device islands in a device structure.For example, the stain isolation structure can be used to create agradient in local rigidity that effectively redistributes the strainaway from the junction region between the stretchable and/or flexibleinterconnects and the rigid device islands.

In an example system, apparatus and method according to the principlesdescribed herein, the buffer structures can be used to facilitatereduction in the concentration of the stress or strain at the junctionregion, i.e., the transition region from a more rigid component (such asbut not limited to a device island) to a more compliant component (suchas but not limited to a stretchable and/or flexible interconnect).

In an example system, apparatus and method according to the principlesdescribed herein, the buffer structure can have a curved conformationthat minimize the stress or strain concentration at or near the sharpedge of integrated circuit (IC) chips. For example, the strain reliefstructure can be formed in a disk conformation, a torus conformation, orother closed curve conformation.

The example buffer structures can be disposed above and/or below thejunction region between a more rigid component (such as but not limitedto a device island) to a more compliant component (such as but notlimited to a stretchable and/or flexible interconnect). The dimensionsof the buffer structures are configured such that at least a portion ofthe buffer structures overlaps the device component and at least aportion of the buffer structure overlaps the junction region between thedevice component and the compliant component.

In an example, the device component can be disposed on or in a flexiblebase, the flexible base being formed of a material having elasticproperties. In this example, at least a portion of the buffer structuresoverlaps the device component and at least a portion of the bufferstructure overlaps the junction region between the device component andthe compliant component.

An example system, apparatus and method according to the principlesdescribed herein can provide a platform of complex device integrationand can be applied to many different kinds of stretchable electronicdevices.

An example system, apparatus and method described herein includes atleast .one strain relief structure that is independent of chip geometry,compatible with conventional semiconductor processes, and provides easeof fabrication.

FIGS. 1A and 1B show top and cross-sectional side views of a conformableelectronic system 100 to which the example system, apparatus and methoddescribed herein can be applied. Example conformable electronic system100 includes device components 102 and compliant components 104encapsulated in an encapsulant 106. The compliant components 104 are inelectrical communication with the device components 102 at a junctionregion 108. In an example, the compliant component 104 can be astretchable and/or flexible interconnect. The encapsulant 106 can be anymaterial having elastic properties, including a polymer or otherpolymeric material. In use, the example conformable electronic system100 can be subjected to stretching, torsion or other forces. As shown inFIG. 1A, the forces can act to cause a stretching or elongation of thesystem along a longitudinal direction (e.g., along. the lines of forcesshown in the figure). The applied forces can cause an amount of stressor strain to be exerted at junction region 108. The stress or strain atjunction region 108 can cause an amount of structural damage at junctionregion 108, including crack formation in, or rupture of, the compliantcomponent 104 or the junction region 108.

FIGS. 2A and 2B show top and cross-sectional side views of a conformableelectronic system 150 that includes device components 102 and compliantcomponents 104 encapsulated in encapsulant 106. The compliant components104 are in electrical communication with the device components 102 atjunction region 108. The device component 102 is disposed in, or atleast partially embedded in, a flexible base 110. The compliantcomponent 104 can be a stretchable and/or flexible interconnect. Theencapsulant 106 can be any material having elastic properties, includinga polymer or other polymeric material. In use, the example conformableelectronic system 100 can be subjected to stretching, torsion or otherforces. The flexible base 110 is to cushion the device component 102. Asdescribed in greater detail in connection with FIGS. 3A, 3B and 4, thestretching or elongation forces can cause an amount of stress or strainnear the junction region.

FIG. 3A show a top views of an example structure that includes devicecomponent 102 disposed in a flexible base 110, encapsulated in anencapsulant 106. FIG. 3B shows results of a finite element analysis ofthe example structure as it is subjected to a stretching or otherelongation force. Table 1 shows the materials properties of thecomponents of this example structure of FIG. 3A, including silicon,which can be a constituent of the device component 110, a polyimide,which can be used to form the flexible base 102, and a silicone, whichcan be used as the encapsulant 106. FIG. 4 shows a plot of thedistribution of strain (computed as Von Mises strain) in the encapsulantand in the flexible base in regions proximate the junction regionbetween the device component and the compliant component.

TABLE 1 Young's modulus (MPa) Poisson ratio Silicon 1.85 × 10⁵ 0.3Polyimide  3.2 × 10³ 0.3 Silicone 0.06 0.485

FIGS. 5A and 5B show top and cross-sectional side views of an exampleapparatus 500 that includes a buffer structure to provide strainisolation. The example apparatus 500 includes a device component 502 anda compliant component 504, encapsulated in encapsulant 506. Thecompliant component 504 is in electrical communication with the devicecomponent 502 at junction region 508. The compliant component 504 can bea stretchable and/or flexible interconnect. The example apparatus ofFIGS. 5A and 5B includes a buffer structure 509 disposed proximate tothe junction region 508 and also encapsulated in the encapsulant 506. Asshown in FIG. 5B, the buffer structure 509 overlaps with at least aportion of the junction region 508. The buffer structure 509 iscomprised of material that has less elastic flexibility than thematerial of the encapsulant 506. As a non-limiting example, the bufferstructure 509 has a higher value of Young's modulus than the encapsulant506. While the example of FIGS. 5A and 5B illustrates the bufferstructure 509 disposed in the example apparatus 500 proximate to andsubstantially below the junction region 508, it is also contemplatedthat the buffer structure 509 can be disposed in the example apparatus500 proximate to and substantially above the junction region 508.

In any example system, apparatus and method described herein, the bufferstructure can be either disposed on the surface of the flexible base(including an elastomer substrate), including being at least partiallyembedded in the flexible base (including an elastomer substrate).

FIGS. 6A and 6B show top and cross-sectional side views of anotherexample apparatus 550 that includes a buffer structure to provide strainisolation. The example apparatus 550 includes the device component 502and the compliant component 504, encapsulated in the encapsulant 506.The compliant component 504 is in electrical communication with thedevice component 502 at junction region 508. The compliant component 504can be a stretchable and/or flexible interconnect. The example apparatusof FIGS. 5A and 5B includes a buffer structure 511 disposed proximate tothe junction region 508 and also encapsulated in the encapsulant 506.Rather than the solid buffer structure 509 shown for the example ofFIGS. 5A and 5B, the buffer structure 511 of FIGS. 6A and 6B is formedwith a substantially hollow portion. As shown in FIG. 5B, the bufferstructure 511 overlaps with at least a portion of the junction region508. The buffer structure 509 is comprised of material that has lesselastic flexibility than the material of the encapsulant 506. As anon-limiting example, the buffer structure 509 has a higher value ofYoung's modulus than the encapsulant 506.

In an example, the inner dimension of the hollow portion of the bufferstructure 511 can be positioned to overlap with a portion of the devicecomponent proximate the junction region 508, and the outer dimension ofthe buffer structure 511 can be positioned to overlap with the junctionregion 508.

In an example, the buffer structure 511 can be formed as an annularstructure. In this example, the inner diameter of the annular bufferstructure can be positioned to overlap with a portion of the flexiblebase, and wherein the outer diameter of the annular buffer structure ispositioned to overlap with the junction region.

FIG. 7A shows a cross-sectional side view of another example apparatus700 that includes a buffer structure to provide strain isolation. Theexample apparatus 700 includes a device component 702 and a compliantcomponent 704, encapsulated in encapsulant 706. The compliant component704 is in electrical communication with the device component 702 atjunction region 708. The compliant component 704 can be a stretchableand/or flexible interconnect. The device component 702 is disposed on,or at least partially embedded in, a flexible base 710. The exampleapparatus of FIG. 7A includes a buffer structure 711 that overlaps withat least a portion of the flexible base 710 and is also encapsulated bythe encapsulant 706. The encapsulant 706 can be any material havingelastic properties, including a polymer or other polymeric material. Theflexible base 710 is formed from a material that has a higher value ofYoung's modulus than the material of the encapsulant. The bufferstructure 711 is formed from a material that has a higher value ofYoung's modulus than the material of the encapsulant.

FIG. 7B shows a cross-sectional side view of another example apparatus750 that includes two buffer structures to provide strain isolation. Theexample of FIG. 7B includes the same type of materials and componentsdescribed above in connection with FIG. 7A. The description above inconnection with the example apparatus 700 of FIG. 7A applies to theexample apparatus 750 of FIG. 7B. The example apparatus 750 of FIG. 7Bincludes two buffer structures 711-a and 711-b that are disposedsubstantially opposite to each other, on either side of the devicecomponent 702 and flexible base 710. In the example of FIG. 7B, acentral point of buffer structure 711-a approximately coincides with acentral point of buffer structure 711-b. In other examples, the twobuffer structures 711-a and 711-b can be displaced relative to eachother in the encapsulant 706 such that a central point of bufferstructure 711-a does not coincide with a central point of bufferstructure 711-b, with buffer structure 711-a and/or buffer structure711-b overlapping with at least a portion of the flexible base 710.

In the example apparatus of FIGS. 7A and 7B, the buffer structure 711,or buffer structures 711-a and 711-b, can be formed as annular bufferstructures. In these example, the inner diameter of the annular bufferstructure can be positioned to overlap a portion of the flexible base710. In another example, the outer diameter of the annular bufferstructure can be positioned over a portion of the junction region 708.

FIG. 8A shows a cross-sectional side view of another example apparatus800 that includes a buffer structure to provide strain isolation. Theexample apparatus 800 includes a device component 802 and a compliantcomponent 804, encapsulated in an encapsulant 806 that is formed fromany material having elastic properties, including a polymer or otherpolymeric material. The compliant component 804 is in electricalcommunication with the device component 802 at junction region 808. Thecompliant component 804 can be a stretchable and/or flexibleinterconnect. The device component 802 is disposed on, or at leastpartially embedded in, a flexible base 810. In the example apparatus ofFIG. 8A, the buffer structure 811 is formed as a substantially solidstructure that overlaps with at least a portion of the flexible base 810and is also encapsulated by the encapsulant 806. The flexible base 810is formed from a material that has a higher value of Young's modulusthan the material of the encapsulant. The buffer structure 811 is formedfrom a material that has a higher value of Young's modulus than thematerial of the encapsulant 806.

FIG. 8B shows a cross-sectional side view of another example apparatus850 that includes two of the buffer structures 811-a and 811-b. Theexample of FIG. 8B includes the same type of materials and componentsdescribed above in connection with FIG. 8A. The description above inconnection with the example apparatus 800 of FIG. 8A applies to theexample apparatus 850 of FIG. 8B. The two buffer structures 811-a and811-b are disposed substantially opposite to each other, on either sideof the device component 802 and flexible base 810, in the example ofFIG. 8B. In other examples, the two buffer structures 811-a and 811-bcan be displaced relative to each other in the encapsulant 806, withbuffer structure 811-a and/or buffer structure 811-b overlapping with atleast a portion of the flexible base 810.

In any example apparatus according to the principles described herein,the buffer structure, including any one or more of buffer structures511, 711, 711-a, 711-b, 811, 811-a, and 811-b, can be formed to have asubstantially cylindrical conformation or to have a substantiallypolygonal prism conformation. FIG. 9A shows an example of bufferstructures that have a substantially polygonal prism conformation, aseither a solid buffer structure 900 or as a buffer structure 910 thatincludes a hollow portion 920. While the example of FIG. 9A is shown ashaving hexagonal symmetry, the buffer structure, including any one ormore of buffer structures 511, 711, 711-a, 711-b, 811, 811-a, and 811-b,can be formed to have hexagonal or any other polygonal symmetry or anirregular structure.

In any example apparatus according to the principles described herein,the buffer structure, including any one or more of buffer structures511, 711, 711-a, 711-b, 811, 811-a, and 811-b, can be formed to have anirregular structure. As shown in FIGS. 9B and 9C, the buffer structurehaving an irregular structure can include at least one protrudingportion that overlaps a portion of the flexible substrate, the junctionregion, and/or a portion of the compliant according to the principles ofany of the examples herein is contemplated.

FIG. 9B shows a top view of another example apparatus that includes abuffer structure to provide strain isolation. The example apparatusincludes a device component 952 and a compliant component 954,encapsulated in an encapsulant 956 that is formed from any materialhaving elastic properties, including a polymer or other polymericmaterial. The compliant component 954 is in electrical communicationwith the device component 802 at junction region 958. The compliantcomponent 954 can be a stretchable and/or flexible interconnect. Thedevice component 952 is disposed on, or at least partially embedded in,a flexible base 960. In the example apparatus of FIG. 9B, the bufferstructure 961 is also encapsulated by the encapsulant 956 and is formedas an irregular structure including a protruding portion 961-a. Thebuffer structure 961 can be disposed in the example apparatus such thatthe protruding portion 961-a overlaps with at least a portion of thedevice component 952, with the junction region 958 and/or with flexiblebase 960. As shown in FIG. 9B, the buffer structure 961 also can bedisposed such that the protruding portion 961-a overlaps with at least aportion of the compliant component 954. The flexible base 960 is formedfrom a material that has a higher value of Young's modulus than thematerial of the encapsulant 956. The buffer structure 961, includingprotruding portion 961-a, is formed from a material that has a highervalue of Young's modulus than the material of the encapsulant 956.

FIG. 9C shows a top view of another example apparatus that includes abuffer structure to provide strain isolation. The example apparatusincludes a device component 982 and a compliant component 984,encapsulated in an encapsulant 986 that is formed from any materialhaving elastic properties, including a polymer or other polymericmaterial. The compliant component 984 is in electrical communicationwith the device component 802 at junction region 988. The compliantcomponent 984 can be a stretchable and/or flexible interconnect. Thedevice component 982 is disposed on, or at least partially embedded in,a flexible base 990. In the example apparatus of FIG. 9B, the bufferstructure 991 is also encapsulated by the encapsulant 986 and is formedas an irregular structure including two protruding portions 991-a and991-b. The buffer structure 991 can be disposed in the example apparatussuch that the protruding portions 991-a and 991-b overlap with at leasta portion of the device component 982, with the junction region 988and/or with flexible base 990. As shown in FIG. 9B, the buffer structure991 also can be disposed such that the protruding portion 991-a and991-b overlap with, and can be disposed along the sides of, at least aportion of the compliant component 984. The flexible base 990 is formedfrom a material that has a higher value of Young's modulus than thematerial of the encapsulant 986. The buffer structure 991, includingprotruding portions 991-a and 991-b, is formed from a material that hasa higher value of Young's modulus than the material of the encapsulant986.

Any example apparatus described herein can be formed as a multi-layerapparatus that includes multi-layer arrangement of the device componentsand the compliant components. In this example, the multi-layer apparatuscan include at least one buffer structure that is positioned relative tothe junction region between at least one device component and at leastone compliant structure according to the principles of any of theexamples described herein. Where the multi-layer apparatus includes adevice component disposed on or at least partially embedded in aflexible base, the multi-layer apparatus can include at least one bufferstructure that is positioned relative to the junction region between atleast one device component and at least one compliant structureaccording to the principles of any of the examples described herein. Invarious examples, the multi-layer apparatus can include two, three, fouror more buffer structures, each of which is positioned in an examplemulti-layer apparatus relative to a device component, a junction region,a flexible substrate, a stretchable, and/or a flexible interconnectaccording to the principles of any of the examples described herein. Inany of the examples that include two or more buffer structures, at leasttwo of the buffer structures can be disposed relative to each other suchthat a central point of the first buffer structure approximatelycoincides with a central point of the second buffer structure, or atleast two of the buffer structures can be disposed relative to eachother such that a central point of the first buffer structure isdisplaced relative to a central point of the second buffer structure.

In another example, the buffer structures described herein can bedisposed in an example apparatus that includes multiple interconnectionsbetween device components. FIG. 10 shows a top view of an exampleapparatus 1000 that includes two buffer structures. The exampleapparatus 1000 includes two device components (devise component 1002-aand device component 1002-b). The example apparatus 1000 includescompliant components 1004-a and 1004-b and compliant components 1005-aand 1005-b, each formed as stretchable and/or flexible interconnect. Asshown in FIG. 10, some of the compliant components (such as compliantcomponents 1004-a and 1004-b) can provide electrical communicationbetween device components at a junction region (such as junction region1008-a). Other compliant components (such as compliant components 1005-aand 1005-b) can provide electrical communication at a junction region(such as junction region 1008-b) between device components and anexternal device, such as device 1018. As also shown in FIG. 10, at leastone of the devise components (devise component 1002-a and/or devicecomponent 1002-b) can be disposed on, or at least partially embedded in,a flexible base (such as flexible base 1010-a or flexible base 1010-b).The example apparatus 1000 can be encapsulated in an encapsulant 1006that is formed from any material having elastic properties, including apolymer or other polymeric material. The example apparatus of FIG. 10also includes buffer structures 1011-a and 1011-b, each of which is alsoencapsulated by the encapsulant 1006. The buffer structures 1011-a and1011-b can be disposed in the example apparatus 1000 such that itoverlaps with at least a portion of a device component (devise component1002-a and device component 1002-b), with a junction region (junctionregion 1008-a or junction region 1008-b), with at least a portion of aflexible base (flexible base 1010-a or flexible base 1010-b), and/orwith at least a portion of a compliant component (compliant components1004-a, 1004-b, 1005-a, or 1005-b). The flexible base 1010-a or 1010-bcan be formed from a material that has a higher value of Young's modulusthan the material of the encapsulant 1006. The buffer structure 1011-aor 1011-b can be formed from a material that has a higher value ofYoung's modulus than the material of the encapsulant 1006.

In any of the example apparatus according to the principles describedherein, the stretchable and/or flexible interconnects can be formed froma conductive material. In any of the examples described herein, theconductive material can be but is not limited to a metal, a metal alloy,a conductive polymer, or other conductive material. In an example, themetal or metal alloy of the coating may include but is not limited toaluminum, stainless steel, or a transition metal (including copper,silver, gold, platinum, zinc, nickel, titanium, chromium, or palladium,or any combination thereof) and any applicable metal alloy, includingalloys with carbon. In other non-limiting example, suitable conductivematerials may include a semiconductor-based conductive material,including a silicon-based conductive material, indium tin oxide or othertransparent conductive oxide, or Group III-IV conductor (includingGaAs). The semiconductor-based conductive material can be doped.

In any of the example apparatus according to the principles describedherein, the intersection structure, the flexible base, and/or theencapsulant can be formed from any material having elastic properties,subject to the described relationship of elastic properties required foreach apparatus. For example, intersection structure, the flexible base,and/or the encapsulant can be formed from a polymer or polymericmaterial. Non-limiting examples of applicable polymers or polymericmaterials include, but are not limited to, a polyimide, a polyethyleneterephthalate (PET), a silicone, or a polyeurethane. Other non-limitingexamples of applicable polymers or polymeric materials include plastics,elastomers, thermoplastic elastomers, elastoplastics, thermostats,thermoplastics, acrylates, acetal polymers, biodegradable polymers,cellulosic polymers, fluoropolymers, nylons, polyacrylonitrile polymers,polyamide-imide polymers, polyarylates, polybenzimidazole, polybutylene,polycarbonate, polyesters, polyetherimide, polyethylene, polyethylenecopolymers and modified polyethylenes, polyketones, poly(methylmethacrylate, polymethylpentene, polyphenylene oxides and polyphenylenesulfides, polyphthalamide, polypropylene, polyurethanes, styrenicresins, sulphone based resins, vinyl-based resins, or any combinationsof these materials. In an example, a polymer or polymeric materialherein can be a UV curable polymer, or a silicone such as but notlimited to ECOFLEX® (BASF, Florham Park, N.J.).

In various examples, the flexible base and the buffer structure can beformed from the same polymer or polymeric material, or from differentpolymers or polymeric materials. In an example, the encapsulant can be asilicone such as but not limited to ECOFLEX® (BASF, Florham Park, N.J.).

For applications in biomedical devices, the encapsulant should bebiocompatible. The stretchable and/or flexible interconnects can beembedded in a polyimide that also acts as a mechanical reinforcement.

In any of the example structures described herein, the stretchableand/or flexible interconnects can have a thickness of about 0.1 μm,about 0.3 μm, about 0.5 μm, about 0.8 μm, about 1 μm, about 1.5 μm,about 2 μm or greater. The buffer structure and/or flexible base canhave a thickness of about 5 μm, about 7.5 μm, about 9 μm, about 12 μm orgreater. In any example herein, the encapsulant can have a thickness ofabout 100 μm, about 125 μm, about 150 μm, about 175 μm, about 200 μm,about 225 μm, about 250 μm, about 300 μm or greater.

FIG. 11A shows a cross-sectional side view of an example apparatus 1100that includes two buffer structures, which is used as a model to performa finite element analysis (described in connection with FIG. 11B). Theexample of FIG. 11A includes a device component 1102 disposed or atleast partially embedded in a flexible base 1110, buffer structures1111-a and 1111-b that are disposed substantially opposite to eachother, on either side of the device component 1102 and flexible base1110, all encapsulated in encapsulant 1106. The example of FIG. 11Aincludes the same type of materials and components described above inconnection with equivalent components of any of the previous exampleapparatus.

FIG. 11B shows the finite element model approximation for theencapsulant 1156, the flexible base 1160, the buffer structure 1161, andthe device component 1152. In this example, the flexible base and thebuffer structures are approximated as being comprised of a polyimide.The encapsulant is approximated as being comprised of a silicone. Thedevice component is approximated as being comprised of a silicon-baseddevice.

FIGS. 12A and 12B show example results of the finite elementcomputations. FIG. 12A show example results of the finite elementcomputations of the example apparatus 1100 of FIG. 11A being subjectedto a stretching or elongation force. FIG. 12B show example results ofthe finite element computations of an example apparatus similar to FIG.11A which does not include buffer structures 1111-a and 1111-b, alsobeing subjected to the stretching or elongation force. FIG. 12B showsthat, in the absence of buffer structures, the area 1260 of higherstrain concentration in the encapsulant coincides with the edge of thedevice component 1250, even though the device component 1250 is disposedin a flexible base. A junction region of an electrical communicationbetween a device component and a compliant structure could be disposedproximate to this edge. Such a concentration of strain as shown in FIG.12B could cause damage to the junction region during a stretching orelongation, including possibly resulting in rupture of the junctionregion. In addition, such a concentration of strain at the edge cancause interfacial delamination between the device component and theflexible base near the edge. By comparison, FIG. 12A shows that thebuffer structures 1210 cause the area 1220 of higher strainconcentration in the encapsulant to shift from the edge of the devicecomponent 1200 or the flexible base, to instead be concentrated in anouter area. As a result, a strain that might develop at the junctionregion of an apparatus is channeled away from that area. Such adistribution of strain as shown in FIG. 12B could reduce the risk of orprevent damage to the junction region during a stretching or elongation,thereby maintaining the performance of the apparatus. In addition, thereis less risk of interfacial delamination between the device componentand the flexible base near the edge. In an example, the buffer structurein FIG. 12A can be extended to the edge of the high strain concentrationregion.

FIG. 13 shows a plot of the von Mises strain and first principal strainversus relative elongation for the computation of FIGS. 12A and 12B. Inparticular, FIG. 13 shows that the values of von Mises strain and firstprincipal strain in the apparatus without a buffer are higher than forthe apparatus that includes a buffer structure.

The example apparatus described herein can be fabricated using anytechnique in the art. For example, the conductive materials of thestretchable and/or flexible interconnects can be fabricated usingevaporation, sputtering, or other deposition technique, and thenpatterned according to the desired conformation. The flexible base, thebuffer structure, and/or the encapsulant can be formed using, e.g.,spin-coating or casting and using a mask or a mold to define the desiredshape of the component.

While various inventive embodiments have been described and illustratedherein, those of ordinary skill in the art will readily envision avariety of other means and/or structures for performing the functionand/or obtaining the results and/or one or more of the advantagesdescribed herein, and each of such variations and/or modifications isdeemed to be within the scope of the inventive embodiments describedherein. More generally, those skilled in the art will readily appreciatethat all parameters, dimensions, materials, and configurations describedherein are meant to be examples and that the actual parameters,dimensions, materials, and/or configurations will depend upon thespecific application or applications for which the inventive teachingsis/are used. Those skilled in the art will recognize, or be able toascertain using no more than routine experimentation, many equivalentsto the specific inventive embodiments described herein. It is,therefore, to be understood that the foregoing embodiments are presentedby way of example only and that inventive embodiments may be practicedotherwise than as specifically described. Inventive embodiments of thepresent disclosure are directed to each individual feature, system,article, material, kit, and/or method described herein. In addition, anycombination of two or more such features, systems, articles, materials,kits, and/or methods, if such features, systems, articles, materials,kits, and/or methods are not mutually inconsistent, is included withinthe inventive scope of the present disclosure.

The above-described embodiments of the invention may be implemented inany of numerous ways. For example, some embodiments may be implementedusing hardware, software or a combination thereof. When any aspect of anembodiment is implemented at least in part in software, the softwarecode may be executed on any suitable processor or collection ofprocessors, whether provided in a single device or computer ordistributed among multiple devices/computers.

Also, the technology described herein may be embodied as a method, ofwhich at least one example has been provided. The acts performed as partof the method may be ordered in any suitable way. Accordingly,embodiments may be constructed in which acts are performed in an orderdifferent than illustrated, which may include performing some actssimultaneously, even though shown as sequential acts in illustrativeembodiments.

All definitions, as defined and used herein, should be understood tocontrol over dictionary definitions, definitions in documentsincorporated by reference, and/or ordinary meanings of the definedterms.

The indefinite articles “a” and “an,” as used herein in thespecification, unless clearly indicated to the contrary, should beunderstood to mean “at least one.”

The phrase “and/or,” as used herein in the specification, should beunderstood to mean “either or both” of the elements so conjoined, i.e.,elements that are conjunctively present in some cases and disjunctivelypresent in other cases. Multiple elements listed with “and/or” should beconstrued in the same fashion, i.e., “one or more” of the elements soconjoined. Other elements may optionally be present other than theelements specifically identified by the “and/or” clause, whether relatedor unrelated to those elements specifically identified. Thus, as anon-limiting example, a reference to “A and/or B”, when used inconjunction with open-ended language such as “comprising” can refer, inone embodiment, to A only (optionally including elements other than B);in another embodiment, to B only (optionally including elements otherthan A); in yet another embodiment, to both A and B (optionallyincluding other elements); etc.

As used herein in the specification, “or” should be understood to havethe same meaning as “and/or” as defined above. For example, whenseparating items in a list, “or” or “and/or” shall be interpreted asbeing inclusive, i.e., the inclusion of at least one, but also includingmore than one, of a number or list of elements, and, optionally,additional unlisted items. Only terms clearly indicated to the contrary,such as “only one of” or “exactly one of,” or “consisting of,” willrefer to the inclusion of exactly one element of a number or list ofelements. In general, the term “or” as used herein shall only beinterpreted as indicating exclusive alternatives (i.e. “one or the otherbut not both”) when preceded by terms of exclusivity, such as “either,”“one of,” “only one of,” or “exactly one of.”

As used herein in the specification, the phrase “at least one,” inreference to a list of one or more elements, should be understood tomean at least one element selected from any one or more of the elementsin the list of elements, but not necessarily including at least one ofeach and every element specifically listed within the list of elementsand not excluding any combinations of elements in the list of elements.This definition also allows that elements may optionally be presentother than the elements specifically identified within the list ofelements to which the phrase “at least one” refers, whether related orunrelated to those elements specifically identified. Thus, as anon-limiting example, “at least one of A and B” (or, equivalently, “atleast one of A or B,” or, equivalently “at least one of A and/or B”) canrefer, in one embodiment, to at least one, optionally including morethan one, A, with no B present (and optionally including elements otherthan B); in another embodiment, to at least one, optionally includingmore than one, B, with no A present (and optionally including elementsother than A); in yet another embodiment, to at least one, optionallyincluding more than one, A, and at least one, optionally including morethan one, B (and optionally including other elements); etc

1. An apparatus comprising: a device component; at least one conductivestretchable and/or flexible interconnect in electrical communicationwith the device component, the at least one conductive stretchableand/or flexible interconnect forming the electrical communication withthe device component at a junction region; a buffer structure; and anencapsulant encapsulating at least the device component and the junctionregion, wherein: the buffer structure overlaps with at least a portionof the junction region; and the buffer structure has a higher value ofYoung's modulus than the encapsulant. 2-44. (canceled)